X-RAY ANALYZER AND X-RAY ANALYSIS METHOD

PROBLEM TO BE SOLVED: To provide an X-ray analyzer capable of easily and directly recognizing a site with a predetermined concentration or higher for a specific element from an X-ray mapped image, and of specifying the site. SOLUTION: The X-ray analyzer includes an X-ray tube 2 for irradiating a sam...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGASAWA KANJI, MATOBA YOSHITAKE
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!