CORRECTION METHOD FOR INTEGRATED CIRCUIT CHARACTERISTIC

PROBLEM TO BE SOLVED: To provide a correction method for an integrated circuit characteristic, for drastically reducing a product development period by controlling a characteristic parameter of an integrated circuit of a device performed with coupling. SOLUTION: This correction method for the integr...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: RIN YUKO, LIN JAOCHING, CHU LIN
Format: Patent
Sprache:eng
Schlagworte:
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