CORRECTION METHOD FOR INTEGRATED CIRCUIT CHARACTERISTIC

PROBLEM TO BE SOLVED: To provide a correction method for an integrated circuit characteristic, for drastically reducing a product development period by controlling a characteristic parameter of an integrated circuit of a device performed with coupling. SOLUTION: This correction method for the integrated circuit characteristic has a step 1S1, a step 2S2 and a step 3S3. The step 1S1 is a step 1 for receiving the characteristic parameter of the device 10 performed with the coupling connected with an interface unit 20. The step 2S2 is a step wherein a data processor 30 is connected to the interface unit 20, for receiving the characteristic parameter of the device 10 performed with the coupling output by the interface unit 20, outputting characteristic data, and calculating an electrical standard fit for the device 10 performed with the coupling. The step 3S3 is a step wherein the data processor 30 writes the characteristic data or the electric standard fit for the device 10 performed with the coupling into the integrated circuit 40 by use of a recording unit. COPYRIGHT: (C)2010,JPO&INPIT