CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CALCULATION

PROBLEM TO BE SOLVED: To provide a tool for calibration with its price held down to a low price, while its offset is calculated at a high accuracy, and to provide a shape measuring instrument and an offset calculating method for the measuring instrument. SOLUTION: This calibrating jig 100 includes a...

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Hauptverfasser:	TAKAHAMA YASUHIRO, NEMOTO KENTARO, YAMAGATA MASAYOSHI, ISHIYAMA TAKU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a tool for calibration with its price held down to a low price, while its offset is calculated at a high accuracy, and to provide a shape measuring instrument and an offset calculating method for the measuring instrument. SOLUTION: This calibrating jig 100 includes a reference ball 112, and a reflector 111 supporting the reference ball 112 from below and regularly reflecting light, when the reference ball 112 is lighted from above. Also, this tool 100 includes a reference block 113 formed on the reflector 111 and has a flat top face. The surface of the reference ball 112 comprises a mirror-finished surface. COPYRIGHT: (C)2010,JPO&INPIT