PROBE AND PROBE CARD
PROBLEM TO BE SOLVED: To provide a probe and a probe card capable of performing stable inspection repeatedly, and a manufacturing method of the probe. SOLUTION: The probe to be provided on the probe card for performing electric inspection to an object is equipped with a connection part 34 to be conn...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | NAGATA KAZUSHI |
| description | PROBLEM TO BE SOLVED: To provide a probe and a probe card capable of performing stable inspection repeatedly, and a manufacturing method of the probe. SOLUTION: The probe to be provided on the probe card for performing electric inspection to an object is equipped with a connection part 34 to be connected to a wiring board of the probe card, a contact part 31 to be brought into contact with an electrode pad of the object, a support part 36 for supporting the contact part 31, a plurality of beam parts 32 extending from the connection part 34 toward the support part 36, and a hinge part 33 for supporting rotatably the plurality of beam parts 32 to the support part and the connection part. COPYRIGHT: (C)2010,JPO&INPIT |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2009300218A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2009300218A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2009300218A3</originalsourceid><addsrcrecordid>eNrjZBAJCPJ3clVw9HNRgLCcHYNceBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvFeAkYGBpbGBgZGhhaMxUYoAjyoeng</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROBE AND PROBE CARD</title><source>esp@cenet</source><creator>NAGATA KAZUSHI</creator><creatorcontrib>NAGATA KAZUSHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a probe and a probe card capable of performing stable inspection repeatedly, and a manufacturing method of the probe. SOLUTION: The probe to be provided on the probe card for performing electric inspection to an object is equipped with a connection part 34 to be connected to a wiring board of the probe card, a contact part 31 to be brought into contact with an electrode pad of the object, a support part 36 for supporting the contact part 31, a plurality of beam parts 32 extending from the connection part 34 toward the support part 36, and a hinge part 33 for supporting rotatably the plurality of beam parts 32 to the support part and the connection part. COPYRIGHT: (C)2010,JPO&INPIT</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2009</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091224&DB=EPODOC&CC=JP&NR=2009300218A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20091224&DB=EPODOC&CC=JP&NR=2009300218A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NAGATA KAZUSHI</creatorcontrib><title>PROBE AND PROBE CARD</title><description>PROBLEM TO BE SOLVED: To provide a probe and a probe card capable of performing stable inspection repeatedly, and a manufacturing method of the probe. SOLUTION: The probe to be provided on the probe card for performing electric inspection to an object is equipped with a connection part 34 to be connected to a wiring board of the probe card, a contact part 31 to be brought into contact with an electrode pad of the object, a support part 36 for supporting the contact part 31, a plurality of beam parts 32 extending from the connection part 34 toward the support part 36, and a hinge part 33 for supporting rotatably the plurality of beam parts 32 to the support part and the connection part. COPYRIGHT: (C)2010,JPO&INPIT</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2009</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAJCPJ3clVw9HNRgLCcHYNceBhY0xJzilN5oTQ3g5Kba4izh25qQX58anFBYnJqXmpJvFeAkYGBpbGBgZGhhaMxUYoAjyoeng</recordid><startdate>20091224</startdate><enddate>20091224</enddate><creator>NAGATA KAZUSHI</creator><scope>EVB</scope></search><sort><creationdate>20091224</creationdate><title>PROBE AND PROBE CARD</title><author>NAGATA KAZUSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2009300218A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2009</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NAGATA KAZUSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NAGATA KAZUSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROBE AND PROBE CARD</title><date>2009-12-24</date><risdate>2009</risdate><abstract>PROBLEM TO BE SOLVED: To provide a probe and a probe card capable of performing stable inspection repeatedly, and a manufacturing method of the probe. SOLUTION: The probe to be provided on the probe card for performing electric inspection to an object is equipped with a connection part 34 to be connected to a wiring board of the probe card, a contact part 31 to be brought into contact with an electrode pad of the object, a support part 36 for supporting the contact part 31, a plurality of beam parts 32 extending from the connection part 34 toward the support part 36, and a hinge part 33 for supporting rotatably the plurality of beam parts 32 to the support part and the connection part. COPYRIGHT: (C)2010,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2009300218A |
| source | esp@cenet |
| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | PROBE AND PROBE CARD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-03T20%3A44%3A08IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NAGATA%20KAZUSHI&rft.date=2009-12-24&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2009300218A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |