TEST DEVICE FOR STORAGE DEVICE AND CONTROL CIRCUIT OF TEST DEVICE

PROBLEM TO BE SOLVED: To quantitatively discriminate whether there is abnormality of unload mechanism when product inspection of a storage device is performed. SOLUTION: In an unload normal condition, an electric signal converted from a noise signal caused by conflict of an actuator and a stopper of...

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Bibliographische Detailangaben
1. Verfasser: NARUMI TOSHIKATSU
Format: Patent
Sprache:eng
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