CONTACT PROBE AND ITS MANUFACTURING METHOD

PROBLEM TO BE SOLVED: To prevent electrolytic corrosion of a surface of a contact probe while suppressing temperature increase of the contact probe when current is applied from the contact probe to an object to be inspected. SOLUTION: This contact probe 1 is formed by stacking, in the thickness dire...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MORI CHIKAOMI, NAKATANI MASAHIRO, NAGATA KAZUSHI, TARUMI KENICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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