AUTOMATIC ANALYZER

PROBLEM TO BE SOLVED: To efficiently ensure reliability of analysis result by enabling quick repairing when abnormality occurs in an automatic analyzer to reduce inoperative time, and automatically performing required reinspection. SOLUTION: This automatic analyzer includes: a storage unit 107 for s...

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Bibliographische Detailangaben
Hauptverfasser: TAKAGI YOSHIMITSU, TOMIYAMA TOMOKO, IIIZUMI NORIKO, MIMURA TOMONORI, IMAI KYOKO, KODAMA RYUICHIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To efficiently ensure reliability of analysis result by enabling quick repairing when abnormality occurs in an automatic analyzer to reduce inoperative time, and automatically performing required reinspection. SOLUTION: This automatic analyzer includes: a storage unit 107 for storing the operation of equipment constituting the automatic analyzer and the operation status of maintenance of the automatic analyzer and the usage histories of expendable supplies provided for analysis; and an analysis ID control unit 108 for giving an ID to the analysis as information for the identifying the analysis to derive a calibration curve. Data stored in the storage unit 107 are developed along the same time axis in the order of samples and analysis items subjected to the analysis and inspection to be output on an entire data display region, developed in the viewpoint of an analysis process of the analysis items of individual samples, so that the data are output on the record of analysis result of each sample. In abnormality cause unfolding, necessary device operation detail information is noticed on facility and time zones with a display means 106 to be arranged so as to be shown. By use of information used to specify an influence range based on a kind of an abnormal state, which is stored beforehand, determination is made as to whether or not is necessary to perform reinspection. COPYRIGHT: (C)2009,JPO&INPIT