THREE-DIMENSIONAL SHAPE MEASURING DEVICE

PROBLEM TO BE SOLVED: To provide a technology for improving the measuring resolution of three-dimensional shape measurement using pattern light for space coding with a simple structure in consideration of the actual condition. SOLUTION: This three-dimensional shape measuring device comprises a first...

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1. Verfasser: TAKAYAMA MUNEHIRO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a technology for improving the measuring resolution of three-dimensional shape measurement using pattern light for space coding with a simple structure in consideration of the actual condition. SOLUTION: This three-dimensional shape measuring device comprises a first pattern image processing unit 33 for forming a space code image from a photographed image of a measuring object to which pattern light for space coding is projected, a weighted average image formation section 34b for forming a weighted average image through weighted average operation from the photographed image of the measuring object on which pattern light for region division having a contrast pattern whose concentration varies periodically and continuously is shifted at a predetermined shift amount and is projected, a pattern composite image formation section 35 for composing the space code image and the weighted average image to form a pattern composite image, and a three-dimensional shape arithmetic section 41 for determining the three-dimensional shape of the measuring object based on the pattern composite image. COPYRIGHT: (C)2009,JPO&INPIT