PROCESSING SYSTEM FOR DEFECT INFORMATION AND PROCESSING METHOD FOR DEFECT INFORMATION

PROBLEM TO BE SOLVED: To provide a processing system for defect information and a processing method for defect information which are capable of analyzing defect information of products on a production line and quickly notifying an operator of the analyzed result. SOLUTION: In a processing system 1 f...

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Bibliographische Detailangaben
Hauptverfasser:	YANAGIMACHI TAKESHI, KONDO HARUHIKO
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a processing system for defect information and a processing method for defect information which are capable of analyzing defect information of products on a production line and quickly notifying an operator of the analyzed result. SOLUTION: In a processing system 1 for defect information which is caused by a production line 100 of products, input display devices 2 are disposed for each operator M along the production line 100. Further, the operator M inputs defect information of a product P into the input display device 2 displaying an image which represents the product P on the input display device 2; and an analyzing device 3 analyzes this defect information. Then, the input display device 2 displays this analyzed result. COPYRIGHT: (C)2009,JPO&INPIT