NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND DEPLETION TYPE MOS TRANSISTOR

PROBLEM TO BE SOLVED: To vary an intrinsic breakdown voltage and a soft breakdown voltage without varying the area of a transistor. SOLUTION: A peripheral circuit for driving a memory cell transistor in a memory cell array includes at least a first transistor. The first transistor includes a gate el...

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Bibliographische Detailangaben
Hauptverfasser: GOMIKAWA KENJI, NOGUCHI MITSUHIRO
Format: Patent
Sprache:eng
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