SEMICONDUCTOR DEVICE AND BURN-IN TESTING DEVICE

PROBLEM TO BE SOLVED: To activate circuits of input terminals and from the input terminals to scan flip-flops. SOLUTION: A burn-in test device includes a test substrate for mounting a semiconductor device and a control part for supplying a control signal and test data for controlling the motion of the burn-in test. The semiconductor device includes a plurality offlip-flops, input terminals, scan output terminals and loop selection circuits. The plurality of flip-flops generate scan chains in scan test. The input terminals are released from external connections in scan test. The scan input terminals input the test data. The scan output terminals output resultant data. The loop selection circuits selectively output either of the resultant data or the test data. The test substrate includes wiring connecting the scan output terminals and input terminals. The control part inputs the test data to the scan input terminals when the burn-in test is started through the test substrate. COPYRIGHT: (C)2009,JPO&INPIT