CAPACITOR INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME

PROBLEM TO BE SOLVED: To provide a capacitor inspection apparatus capable of measuring the impedance of capacitor within a very short time and with high accuracy, and an inspecting method employing the device by resolving the problem, wherein it is difficult to obtain both high-speed measurements of...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	YOSHINO TAKESHI, KAWAHITO KAZUO, AOSHIMA YOICHI, KURITA JUNICHI
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CAPACITORS CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES ORLIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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