FAILURE PREDICTION APPARATUS, FAILURE PREDICTION METHOD AND FAILURE PREDICTION PROGRAM

PROBLEM TO BE SOLVED: To automatically and accurately predict the failure of a laser diode. SOLUTION: A failure prediction section 180 comprises: an actual measurement information input section 500 for inputting the value of a current that flows to the laser diode measured at predetermined time inte...

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Bibliographische Detailangaben
Hauptverfasser: NORIMATSU SATSUKI, SAKANE YUICHIRO, HORIUCHI AKIHIRO, YAMAMOTO AKIRA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To automatically and accurately predict the failure of a laser diode. SOLUTION: A failure prediction section 180 comprises: an actual measurement information input section 500 for inputting the value of a current that flows to the laser diode measured at predetermined time intervals; an actual measurement information storing section 510 for storing the current value inputted by the actual measurement information input section 500 and the measurement time in a paired manner; a change point detection section 530 for detecting a current value at one measurement time stored by the actual measurement information storing section 510, which has a change equal to or greater than a predetermined value relative to the current value at the measurement time immediately before; and a prediction curve generating section 560 for generating a prediction curve that indicates a relationship between the elapsed time and the current value applicable at and after the measurement time of the detected current value on the basis of the current value detected by the change point detection section 530 and the change information of the current value corresponding to the elapsed time from beginning of usage of the laser diode. COPYRIGHT: (C)2009,JPO&INPIT