JITTER MEASURING DEVICE

PROBLEM TO BE SOLVED: To easily and accurately measure the jitter characteristics of a high-speed data signal. SOLUTION: A signal converting means 25 converts a data signal Dr of an NRZ-form data signal Dr of a predetermined pattern, repeatedly output from an object 1 to be measured into an RZ-form...

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Bibliographische Detailangaben
Hauptverfasser: MOCHIZUKI TAKESHI, NISHIOHARA MASANORI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To easily and accurately measure the jitter characteristics of a high-speed data signal. SOLUTION: A signal converting means 25 converts a data signal Dr of an NRZ-form data signal Dr of a predetermined pattern, repeatedly output from an object 1 to be measured into an RZ-form data signal Dr', and a divider 28 divides the RZ-form data signal Dr' by a value which is coprime to the number of the transition frequency of data in a sign period of the NRZ-form data signal Dr. Thus, a data signal Dr" that has a bit rate lower than the original data signal and includes information on all data transition timings in the sign period of the original data signal is obtained, and the jitters are measured by a jitter measuring section 30. COPYRIGHT: (C)2009,JPO&INPIT