SURFACE INSPECTION DEVICE AND SURFACE INSPECTION METHOD

PROBLEM TO BE SOLVED: To obtain a surface inspection device for accurately inspecting the surface of moving matter by a simple constitution. SOLUTION: The surface inspection device is constituted so that the respective parts of the moving matter are successively imaged while relatively moving the moving matter and the surface of the moving matter is inspected on the basis of the image of the moving matter obtained by combining the images of the respective imaged parts and equipped with a degree-of-shrinkage calculation part 12 for calculating the degree of shrinkage on the image, which are changed by a change in the speed of the moving matter when the moving matter is imaged, on the basis of the actual dimension of the moving matter and the number of the pixels on the image of the moving matter at every predetermined region of the moving matter, an image correcting part 13 for correcting the images of the respective regions of the moving matter to images of the ratio corresponding to the actual dimension of the moving matter on the basis of the degree of shrinkage, and a surface inspection part 14 for extracting the surface abnormality of the moving matter using the images after correction and calculating the actual dimension of the extracted surface abnormality part on the basis of the number of the pixels on the image of the extracted surface abnormality part. COPYRIGHT: (C)2009,JPO&INPIT