TEST METHOD FOR DETECTING DEFECT ON MAGNETIC DISK, AND MANUFACTURING METHOD OF MAGNETIC DISK DRIVE DEVICE

PROBLEM TO BE SOLVED: To perform the defect inspection of a magnetic disk efficiently with high reliability. SOLUTION: In a defect detecting test of a magnetic disk about one embodiment, after data are written in an object data track (DTr_m, DTr_1), data are written in adjacent data track (DTr_m-1,...

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Bibliographische Detailangaben
Hauptverfasser: SERA AKIHIRO, TOKIZONO AKIRA, FUJITA SATORU, NODA JUNZO, SATO HISAAKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To perform the defect inspection of a magnetic disk efficiently with high reliability. SOLUTION: In a defect detecting test of a magnetic disk about one embodiment, after data are written in an object data track (DTr_m, DTr_1), data are written in adjacent data track (DTr_m-1, DTr_1+1), and data are read out from the object data track. Write-in for the adjacent data track is applied to only one side of an inner peripheral side or an outer peripheral side. In the defect detecting test of this form, the magnetic disk is divided into two, and a different adjacent data track is selected as the adjacent data track performing write-in in a region of the inner peripheral side and a region of the outer peripheral side. for example, in the defect detecting test of this form, data are written in only the inner peripheral side adjacent data track in the inner peripheral side region and data are written in only the outer peripheral side adjacent data track in the outer peripheral side region. COPYRIGHT: (C)2009,JPO&INPIT