PATENT EXAMINATION SUPPORT SYSTEM, PATENT EXAMINATION SUPPORT METHOD, AND PATENT EXAMINATION SUPPORT PROGRAM

PROBLEM TO BE SOLVED: To achieve estimation of a place under consideration and presentation to an examiner side based on the operation history of a searcher in the retrieval of a document. SOLUTION: A patent examination support system 100 is configured of: an operation history storage means 110 for...

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Bibliographische Detailangaben
Hauptverfasser: SUDO TAKESHI, SENO YUKI, HIRATA NORIHIRO, HAYASHI TOMOTAKA
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To achieve estimation of a place under consideration and presentation to an examiner side based on the operation history of a searcher in the retrieval of a document. SOLUTION: A patent examination support system 100 is configured of: an operation history storage means 110 for acquiring an operation instruction performed by a searcher, and for storing it in an operation history database 126 as the operation history of each document; a feature term extraction means 111 for executing the text analysis of document data, and for creating the list of featured terms matched with a prescribed reference; a history specification means 112 for specifying the operation history executed for a region in which the feature term is included about each feature term; and a significant word/phase estimation means 113 for retrieving significance of the type of the specified operation history by a weight table 127, and for calculating a total value by multiplying the content data of each operation history by each significance for each feature term, and for transmitting the feature term which is equal to or more than a prescribed value to an examiner terminal 20 as a significant word/phase. COPYRIGHT: (C)2009,JPO&INPIT