FACTOR ESTIMATION SUPPORT DEVICE AND METHOD OF CONTROLLING THE SAME, AND FACTOR ESTIMATION SUPPORT PROGRAM

PROBLEM TO BE SOLVED: To provide a factor estimation support device capable of easily estimating abnormal factors. SOLUTION: A factor estimating support device 10 supports estimation of factors from a result generated in a production system. In the factor estimating support device 10, material/envir...

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Hauptverfasser: TAZAKI HIROSHI, TSUTSUMI YUMI, IWAMI TARO, INABA HIRONORI, TSURUTA KOSUKE, YAMAMURO SUSUMU, KOUJIYA KAZUTO, KAWAI TAKUMA, HASEGAWA YOSHIFUMI, NAKAJIMA HIROSHI, OTANI MASARU
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a factor estimation support device capable of easily estimating abnormal factors. SOLUTION: A factor estimating support device 10 supports estimation of factors from a result generated in a production system. In the factor estimating support device 10, material/environment history data 40 and test history data 41 obtained from the production system and causality structure data 42 indicating causality among the plurality of variables are stored in the storage part 21, where when determined that the final quality characteristic is abnormal by a final quality abnormal detecting part 32, determination is made on whether each variable other than the final quality characteristic is abnormal in a variable abnormality detecting part 33, and the result of determination is reflected on a visible image in which the causality structure data 42 are made visible in a visible image creating part 34. COPYRIGHT: (C)2009,JPO&INPIT