INSPECTION SIGNAL GENERATING DEVICE AND SEMICONDUCTOR TEST DEVICE

PROBLEM TO BE SOLVED: To provide an inspection signal generating device and a semiconductor test device equipped with the inspection signal generating device concerned capable of reducing the time needed to inspection due to enhancement of the degree of freedom for address control. SOLUTION: The ins...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	KUREBAYASHI SHINYA
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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