SAMPLE SUPPORT STAGE FOR OBSERVING THREE-DIMENSIONAL STRUCTURE, PROTRACTOR AND THREE-DIMENSIONAL STRUCTURE OBSERVING METHOD

PROBLEM TO BE SOLVED: To provide a sample support stage for observing a three-dimensional structure of high versatility with a sample constitution while adopting a constitution capable of always holding a sample in the visual field center of an electron microscope, a protractor and a three-dimension...

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Bibliographische Detailangaben
Hauptverfasser: TANAKA NOBUO, YOSHIDA KENTA, SAITO AKIRA, HIRAYAMA TSUKASA, YAMAZAKI JUN, NAE RAI, YAMAMOTO KAZUO
Format: Patent
Sprache:eng
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