TEST PIECE MOVING STAGE COMPRISING STRAIN MECHANISM MODULE FOR ABSORBING DEFORMATION OF SLIDE

PROBLEM TO BE SOLVED: To provide a test piece moving stage which prevents deformation of a slide, that occurs when the test piece moving stage is slid, from being transmitted to a test piece table. SOLUTION: A test piece is moved by a movable part to which a first slide that is attached to a base fr...

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Bibliographische Detailangaben
Hauptverfasser: JUNG HON TAEK, GWEON DAE GAB, CHOI YOUNG MAN, KIM JUNE JAE, AHN DA HOON
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a test piece moving stage which prevents deformation of a slide, that occurs when the test piece moving stage is slid, from being transmitted to a test piece table. SOLUTION: A test piece is moved by a movable part to which a first slide that is attached to a base frame to move along a first guide block and a second slide that is attached to the first slide to move along a second guide block are fitted in the direction across each other, as well as a test piece table that is fitted through a strain mechanism module 50 formed at the second slide. The strain mechanism 50 comprises many buffer holes 53 that regularly penetrate the upper surface of the second slide with a constant interval along the vertical direction, and many deformation lines 54 that are so cut as to hit the center of the buffer hole 53 to present a deformation space of a bridge part 56, to which the test piece table is attached, and a fitting part 52. So the deformation caused by the slide is not transmitted to the test piece table. COPYRIGHT: (C)2009,JPO&INPIT