MEASURING METHOD, MEASURING APPARATUS, AND PROGRAM

PROBLEM TO BE SOLVED: To provide a measuring method, a measuring apparatus, and a program which can measure the shape of a carrier tape having a recessed portion for accommodating an electronic component with high precision. SOLUTION: The measuring method measures the shape of a carrier tape in whic...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NAKAGAWA SEISHI
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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