MAGNETIZATION CHARACTERISTIC MEASURING DEVICE
PROBLEM TO BE SOLVED: To provide a magnetization characteristic measuring device manufacturable inexpensively, capable of measuring highly accurately the magnetization state of a measuring object. SOLUTION: In this magnetization characteristic measuring device 1, the measuring object 100 is irradiat...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a magnetization characteristic measuring device manufacturable inexpensively, capable of measuring highly accurately the magnetization state of a measuring object. SOLUTION: In this magnetization characteristic measuring device 1, the measuring object 100 is irradiated with light through a polarizer 12, and reflected light from the measuring object 100 is received through a polarizer 15, to thereby measure the magnetization state of the measuring object. The device 1 has a constitution wherein a control part 30 drives a rotation driving means 18, while detecting a light receiving quantity on a measuring object point by a light receiving means 16, and thereby a rotation angle of the polarizer 15 at which the light receiving quantity becomes a prescribed value is detected as the magnetization state of the measuring object 100. COPYRIGHT: (C)2009,JPO&INPIT |
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