MAGNETIZATION CHARACTERISTIC MEASURING DEVICE

PROBLEM TO BE SOLVED: To provide a magnetization characteristic measuring device manufacturable inexpensively, capable of measuring highly accurately the magnetization state of a measuring object. SOLUTION: In this magnetization characteristic measuring device 1, the measuring object 100 is irradiat...

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Bibliographische Detailangaben
1. Verfasser: IZAWA FUMIHITO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a magnetization characteristic measuring device manufacturable inexpensively, capable of measuring highly accurately the magnetization state of a measuring object. SOLUTION: In this magnetization characteristic measuring device 1, the measuring object 100 is irradiated with light through a polarizer 12, and reflected light from the measuring object 100 is received through a polarizer 15, to thereby measure the magnetization state of the measuring object. The device 1 has a constitution wherein a control part 30 drives a rotation driving means 18, while detecting a light receiving quantity on a measuring object point by a light receiving means 16, and thereby a rotation angle of the polarizer 15 at which the light receiving quantity becomes a prescribed value is detected as the magnetization state of the measuring object 100. COPYRIGHT: (C)2009,JPO&INPIT