IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS
PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 3...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | SAKURAI JUNZO |
| description | PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 31 including a member 43a cutting off light incident on the CCD 32a; a control function of storing a dark-time signal of the CCD 32a shielded by the member 43a from the light in a first storage means; a pixel defect detecting function of detecting the pixel defect, on the basis of the dark-time signal; a second storage means stored with position information on the pixel defect; a controller 33 which detects a light shield leakage on the basis of the dark-time signal; and a CRT monitor 35 which displays information associated with the light shield leak, when the controller 33 detects light shield leakage. COPYRIGHT: (C)2009,JPO&INPIT |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2008301521A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2008301521A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2008301521A3</originalsourceid><addsrcrecordid>eNrjZIjw9HV09_RzV3AMCHAMcgwJDVZw8w9S8PV0DvIPdvYPcNVRcPRzUQjwjHD1UXBxdXN1DgFSIUAKpMnXNcTD30XB300BwxgeBta0xJziVF4ozc2g5OYa4uyhm1qQH59aXJCYnJqXWhLvFWBkYGBhbGBoamToaEyUIgAnejFN</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS</title><source>esp@cenet</source><creator>SAKURAI JUNZO</creator><creatorcontrib>SAKURAI JUNZO</creatorcontrib><description>PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 31 including a member 43a cutting off light incident on the CCD 32a; a control function of storing a dark-time signal of the CCD 32a shielded by the member 43a from the light in a first storage means; a pixel defect detecting function of detecting the pixel defect, on the basis of the dark-time signal; a second storage means stored with position information on the pixel defect; a controller 33 which detects a light shield leakage on the basis of the dark-time signal; and a CRT monitor 35 which displays information associated with the light shield leak, when the controller 33 detects light shield leakage. COPYRIGHT: (C)2009,JPO&INPIT</description><language>eng</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081211&DB=EPODOC&CC=JP&NR=2008301521A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081211&DB=EPODOC&CC=JP&NR=2008301521A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SAKURAI JUNZO</creatorcontrib><title>IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS</title><description>PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 31 including a member 43a cutting off light incident on the CCD 32a; a control function of storing a dark-time signal of the CCD 32a shielded by the member 43a from the light in a first storage means; a pixel defect detecting function of detecting the pixel defect, on the basis of the dark-time signal; a second storage means stored with position information on the pixel defect; a controller 33 which detects a light shield leakage on the basis of the dark-time signal; and a CRT monitor 35 which displays information associated with the light shield leak, when the controller 33 detects light shield leakage. COPYRIGHT: (C)2009,JPO&INPIT</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjw9HV09_RzV3AMCHAMcgwJDVZw8w9S8PV0DvIPdvYPcNVRcPRzUQjwjHD1UXBxdXN1DgFSIUAKpMnXNcTD30XB300BwxgeBta0xJziVF4ozc2g5OYa4uyhm1qQH59aXJCYnJqXWhLvFWBkYGBhbGBoamToaEyUIgAnejFN</recordid><startdate>20081211</startdate><enddate>20081211</enddate><creator>SAKURAI JUNZO</creator><scope>EVB</scope></search><sort><creationdate>20081211</creationdate><title>IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS</title><author>SAKURAI JUNZO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2008301521A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SAKURAI JUNZO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SAKURAI JUNZO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS</title><date>2008-12-11</date><risdate>2008</risdate><abstract>PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 31 including a member 43a cutting off light incident on the CCD 32a; a control function of storing a dark-time signal of the CCD 32a shielded by the member 43a from the light in a first storage means; a pixel defect detecting function of detecting the pixel defect, on the basis of the dark-time signal; a second storage means stored with position information on the pixel defect; a controller 33 which detects a light shield leakage on the basis of the dark-time signal; and a CRT monitor 35 which displays information associated with the light shield leak, when the controller 33 detects light shield leakage. COPYRIGHT: (C)2009,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_JP2008301521A |
| source | esp@cenet |
| subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
| title | IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-22T11%3A09%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SAKURAI%20JUNZO&rft.date=2008-12-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2008301521A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |