IMAGING APPARATUS FOR MICROSCOPE, AND PIXEL DEFECT DETECTING METHOD OF IMAGING APPARATUS

PROBLEM TO BE SOLVED: To detect a pixel defect (including pixel defects occurring subsequently) with high accuracy, without having to depend on the ambient temperature. SOLUTION: An imaging apparatus for a microscope has a camera 32, including a CCD 32a picking up a sample image; a microscope body 31 including a member 43a cutting off light incident on the CCD 32a; a control function of storing a dark-time signal of the CCD 32a shielded by the member 43a from the light in a first storage means; a pixel defect detecting function of detecting the pixel defect, on the basis of the dark-time signal; a second storage means stored with position information on the pixel defect; a controller 33 which detects a light shield leakage on the basis of the dark-time signal; and a CRT monitor 35 which displays information associated with the light shield leak, when the controller 33 detects light shield leakage. COPYRIGHT: (C)2009,JPO&INPIT