NON-DESTRUCTIVE INSPECTION METHOD, AND NON-DESTRUCTIVE INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide a non-destructive inspection method and non-destructive inspection device capable of inspecting simply with high accuracy as compared with a conventional method and device. SOLUTION: An X-ray 2 emitted from an X-ray source 1 is irradiated on an subject 3, the intensi...

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Bibliographische Detailangaben
Hauptverfasser: KATO MASAYO, KONAGAI CHIKARA, NITTO KOICHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a non-destructive inspection method and non-destructive inspection device capable of inspecting simply with high accuracy as compared with a conventional method and device. SOLUTION: An X-ray 2 emitted from an X-ray source 1 is irradiated on an subject 3, the intensity of the X-rays 2 transmitting through the subject 3 is detected by an image intensifier 4, and a detection signal is processed by an image processor 7 and a computer 8 and are displayed on a monitor 9. A tube voltage corresponding to energy of the X-ray source 1 and a tube current corresponding to the intensity are adjustable by a radiation source controller 6. A metal plate 12 as a mask for attenuating the X-ray 2 can be inserted in the front surface of the subject 3, and the thickness of the mask can be changed by the number of the metal plates 12. The image intensifier 4 detects X-rays, (a) which transmits only through the metal plate 12 but will not transmit through the subject 3, and X-rays b, c which transmit through the metal plate 12 and the inside of the subject 3. COPYRIGHT: (C)2009,JPO&INPIT