IC CHIP

PROBLEM TO BE SOLVED: To provide an IC chip capable of raising an insulation performance between bumps, when the IC chip is fixed by an ACF. SOLUTION: In bumps 14 which are arranged at a bottom face of an IC chip 12 in a stagger shape, there is provided a gap A between a bump 14 of a primary sequenc...

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Bibliographische Detailangaben
Hauptverfasser: HASEGAWA TATSUYA, KAMOTO TAKESHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an IC chip capable of raising an insulation performance between bumps, when the IC chip is fixed by an ACF. SOLUTION: In bumps 14 which are arranged at a bottom face of an IC chip 12 in a stagger shape, there is provided a gap A between a bump 14 of a primary sequence and a bump 14 of a secondary sequence, and this gap A is set larger than twice the diameter of a conductive particle 20 contained in an ACF 18. COPYRIGHT: (C)2009,JPO&INPIT