METAL GLASS EVALUATION METHOD AND APPARATUS

PROBLEM TO BE SOLVED: To provide a metal glass evaluation method capable of precisely and simply evaluating the existence of the crystallization or internal flaw of metal glass by a single method, and to provide a metal glass evaluation apparatus. SOLUTION: AC is applied to the coil brought into con...

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Bibliographische Detailangaben
Hauptverfasser: FUKUHARA MIKIO, INOUE AKIHISA, WANG XINMIN, KIMURA HISAMICHI, TAKAGI TOSHIYUKI, ABE TOSHIHIKO, UCHIKAZU TETSUYA, ENDO HISASHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a metal glass evaluation method capable of precisely and simply evaluating the existence of the crystallization or internal flaw of metal glass by a single method, and to provide a metal glass evaluation apparatus. SOLUTION: AC is applied to the coil brought into contact with the surface of the metal glass and, on the basis of a change in the produced eddy current signal, presence of crystallization or internal flaw of the metal glass is detected. According to such a configuration, this method which is different from X-ray diffraction method or X-ray transmission method that accompanies hazards and thermal analysis method that requires cutting of a material, and the presence of the crystallization or internal flaw of the metal glass can be evaluated safely, accurately and simply by a single method. COPYRIGHT: (C)2008,JPO&INPIT