MINUTE TEST PIECE POLISHING DEVICE

PROBLEM TO BE SOLVED: To provide a minute test piece polishing device which hardly bends or damages a minute test piece, and makes the quality of the manufactured minute test piece uniform with high working efficiency. SOLUTION: In this minute test piece polishing device 1, the surface of the minute...

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Bibliographische Detailangaben
1. Verfasser:	TSURUI TAKAFUMI
Format:	Patent
Sprache:	eng
Schlagworte:	DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING PERFORMING OPERATIONS POLISHING TRANSPORTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a minute test piece polishing device which hardly bends or damages a minute test piece, and makes the quality of the manufactured minute test piece uniform with high working efficiency. SOLUTION: In this minute test piece polishing device 1, the surface of the minute test piece 3 with round cross section is polished by using a string-like member 13. The device is composed of: a string-like member delivery and recovery means 10; a polishing material attaching means 20; a gripping and rotating means 30; and a pressing and scanning means 40. The polishing material is attached to the string-like member delivered by the string-like member delivery and recovery means 10 by the polishing material attaching means 20. Then, the string-like member 13 with the polishing agent is pressed and scanned by the pressing and scanning means 40 relative to the minute test piece 3 gripped and rotated by the gripping and rotating means 30, thereby polishing the minute test piece 3. COPYRIGHT: (C)2008,JPO&INPIT