DEVICE FOR INSPECTING CIRCUIT BOARD

PROBLEM TO BE SOLVED: To solve a problem wherein inspection efficiency gets low by a replacement period of a contact probe or an anisotropic conductive sheet contacting with a bump. SOLUTION: A device inspects an electric characteristic in a circuit board 10 of an inspection object formed with solde...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KAJIKI ATSUNORI, YAMANISHI SATOO, YOSHINO HIRONARI, TSUBOTA TAKASHI, INOUE AKINOBU, AKAIKE SADAKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING
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