FILM FORMATION MATERIAL AND METHOD

PROBLEM TO BE SOLVED: To provide a film formation material and a film formation method capable of forming an insulating film (dielectric film) in a semiconductor device (element) where a film that can improve signal processing speed, has small permittivity, has mechanical strength capable of withsta...

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Hauptverfasser: JO EIKA, MACHIDA HIDEAKI, MURAMOTO IKUYO
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creator JO EIKA
MACHIDA HIDEAKI
MURAMOTO IKUYO
description PROBLEM TO BE SOLVED: To provide a film formation material and a film formation method capable of forming an insulating film (dielectric film) in a semiconductor device (element) where a film that can improve signal processing speed, has small permittivity, has mechanical strength capable of withstanding CMP (chemical/mechanical polishing), further has high in-plane uniformity in the formed film, and has small variations among lots is easily formed under gentle film formation conditions (having a wide range of optimum film formation conditions). SOLUTION: The material for forming a film is an Si compound, having one cycloalkyl group having 4-7 carbons, one alkyl group having 1-3 carbons, and two alkoxy groups having 1-3 carbons. COPYRIGHT: (C)2008,JPO&INPIT
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subjects BASIC ELECTRIC ELEMENTS
CHEMICAL SURFACE TREATMENT
CHEMISTRY
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
COATING MATERIAL WITH METALLIC MATERIAL
COATING METALLIC MATERIAL
DIFFUSION TREATMENT OF METALLIC MATERIAL
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL
METALLURGY
SEMICONDUCTOR DEVICES
SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION
title FILM FORMATION MATERIAL AND METHOD
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