WAFER HOLDER AND WAFER PROBER INSTALLED WITH THE SAME

PROBLEM TO BE SOLVED: To provide a wafer holder that can improve positional accuracy and temperature uniformity to be improved and the chip to be heated and cooled rapidly by reducing deformation even if a high load is applied thereto, and improving the heat insulation effect, and to provide a wafer...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ITAKURA KATSUHIRO, NISHI TERUHITO, AWAZU TOMOYUKI, NAKADA HIROHIKO, NATSUHARA MASUHIRO
Format: Patent
Sprache:eng
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