METHOD OF FORMING Ru FILM AND METAL WIRING STRUCTURE

PROBLEM TO BE SOLVED: To provide a method of forming a continuous ruthenium (Ru) thin film in a wiring structure used in a high-speed logic circuit element. SOLUTION: A method of depositing a ruthenium (Ru) thin film on a substrate includes the following steps of: (i) processing a surface of the sub...

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Bibliographische Detailangaben
Hauptverfasser: JINRIKI HIROSHI, INOUE HIROAKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a method of forming a continuous ruthenium (Ru) thin film in a wiring structure used in a high-speed logic circuit element. SOLUTION: A method of depositing a ruthenium (Ru) thin film on a substrate includes the following steps of: (i) processing a surface of the substrate with an organometallic precursor; (ii) adsorbing a ruthenium precursor to the processed surface of the substrate; (iii) processing the adsorbed ruthenium precursor with an excited reducing gas; and (iv) repeating the steps (ii) and (iii) to form the ruthenium thin film on the substrate. COPYRIGHT: (C)2008,JPO&INPIT