DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION
PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpie...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | HIGUCHI HIROBUMI HIGUCHI TAKEMITSU |
description | PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product. SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized. COPYRIGHT: (C)2008,JPO&INPIT |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2008089561A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2008089561A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2008089561A3</originalsourceid><addsrcrecordid>eNqNjLEKwjAURbs4iPoPDycdhKpU6vhIXttITEKSziVoOpVaaP8fM_gBTpfLueeus56TJ-aFVvAk32gOugKhXCvRawtckEzYCgZSOweoaklwYCglcUAHSxjfcVjCMUmAxqBF3zrgrRWqBm0o9XS-zVZ9GOa4--Um21fkWXOK06eL8xRecYxL9zCXPC_z8l7cznj9a_QFcTs2Pg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION</title><source>esp@cenet</source><creator>HIGUCHI HIROBUMI ; HIGUCHI TAKEMITSU</creator><creatorcontrib>HIGUCHI HIROBUMI ; HIGUCHI TAKEMITSU</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product. SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized. COPYRIGHT: (C)2008,JPO&INPIT</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2008</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080417&DB=EPODOC&CC=JP&NR=2008089561A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20080417&DB=EPODOC&CC=JP&NR=2008089561A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIGUCHI HIROBUMI</creatorcontrib><creatorcontrib>HIGUCHI TAKEMITSU</creatorcontrib><title>DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION</title><description>PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product. SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized. COPYRIGHT: (C)2008,JPO&INPIT</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2008</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjLEKwjAURbs4iPoPDycdhKpU6vhIXttITEKSziVoOpVaaP8fM_gBTpfLueeus56TJ-aFVvAk32gOugKhXCvRawtckEzYCgZSOweoaklwYCglcUAHSxjfcVjCMUmAxqBF3zrgrRWqBm0o9XS-zVZ9GOa4--Um21fkWXOK06eL8xRecYxL9zCXPC_z8l7cznj9a_QFcTs2Pg</recordid><startdate>20080417</startdate><enddate>20080417</enddate><creator>HIGUCHI HIROBUMI</creator><creator>HIGUCHI TAKEMITSU</creator><scope>EVB</scope></search><sort><creationdate>20080417</creationdate><title>DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION</title><author>HIGUCHI HIROBUMI ; HIGUCHI TAKEMITSU</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2008089561A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2008</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIGUCHI HIROBUMI</creatorcontrib><creatorcontrib>HIGUCHI TAKEMITSU</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIGUCHI HIROBUMI</au><au>HIGUCHI TAKEMITSU</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION</title><date>2008-04-17</date><risdate>2008</risdate><abstract>PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product. SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized. COPYRIGHT: (C)2008,JPO&INPIT</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_JP2008089561A |
source | esp@cenet |
subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-13T18%3A58%3A35IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIGUCHI%20HIROBUMI&rft.date=2008-04-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2008089561A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |