DETECTION METHOD OF INSULATOR DIELECTRIC LOSS ANGLE (CALLED AS tandelta) IN APPARATUS DURING OPERATION

PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpie...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HIGUCHI HIROBUMI, HIGUCHI TAKEMITSU
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a mathematical processing method capable of calculating tanδ which is an index of the deterioration degree, though tanδ which is a dielectric loss angle to a high insulator cannot be measured hitherto, and to provide a method for detecting tanδ to an electric workpiece during charging or an object being moved on an operation line of a product. SOLUTION: A circuit impedance and a phase are measured in each frequency by applying a variable frequency in a high frequency domain to a test object, and a least-squares method or a vector locus of a complex relative dielectric constant is used in correspondence with an attenuation constant of Maxwell electromagnetic equation and a phase constant, and a calculation procedure of tanδ can be provided from the dielectric constant corresponding to a phase extreme value point. Furthermore, a current is made to flow through a stray capacitance between a test object being moved on a manufacture line or the like and a support instrument, and tanδ of a moving object is detected, and a system capable of performing quality control can be organized. COPYRIGHT: (C)2008,JPO&INPIT