INSPECTION APPARATUS OF RFID TAG
PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of inspecting an RFID tag in a state similar to a state that the RFID tag is attached to an attaching target. SOLUTION: The inspection apparatus for inspecting an RFID tag 11a to be attached to a dielectric substance having a prescribe...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an inspection apparatus capable of inspecting an RFID tag in a state similar to a state that the RFID tag is attached to an attaching target. SOLUTION: The inspection apparatus for inspecting an RFID tag 11a to be attached to a dielectric substance having a prescribed dielectric constant and used before attaching the RFID tag 11a to the dielectric substance is provided with a mounting part 1a on which the RFID tag 11a can be arranged, an antenna part capable of transmitting an inspection radio wave to the mounting part and receiving a response radio wave from the RFID tag, and a control part connected to the antenna part. Identification information is recorded in the RFID tag 11a, the RFID tag 11a transmits a response radio wave to which the identification information is added, and the dielectric constant of the mounting part is approximately the same as the dielectric constant of the dielectric substance to which the RFID tag is attached. When an inspection command signal is received from the control part, the antenna part transmits an inspection radio wave to the mounting part, and when a response radio wave is received, extracts the identification information from the response radio wave, transmits the identification information to the control part. When the identification information can be received, the control part judges that the RFID tag is normal. COPYRIGHT: (C)2008,JPO&INPIT |
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