THREE-DIMENSIONAL DISPLACEMENT MEASURING DEVICE AND MEASURING METHOD

PROBLEM TO BE SOLVED: To provide a measuring device and a measuring method capable of measuring highly-accurate omnidirectional displacement inexpensively with a simple mechanism. SOLUTION: This three-dimensional displacement measuring device is characterized by having a prescribed matrix pattern 20...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Hauptverfasser:	KOTO ATSUSHI, YAMAMOTO TAKAKO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a measuring device and a measuring method capable of measuring highly-accurate omnidirectional displacement inexpensively with a simple mechanism. SOLUTION: This three-dimensional displacement measuring device is characterized by having a prescribed matrix pattern 20 applied onto the surface of a measuring object 1, and a pair of image side telecentric optical systems having each main optical axis facing to the matrix pattern 20. COPYRIGHT: (C)2008,JPO&INPIT