POLARIZATION MICROSCOPE, MAGNETIC FIELD APPLYING PART FOR THE POLARIZATION MICROSCOPE AND MAGNETIC FIELD APPLICATION METHOD

PROBLEM TO BE SOLVED: To efficiently apply a relatively large magnetic field to a measuring target, for a polarization microscope and based on this, to observe the dynamic magnetization response of the measuring target. SOLUTION: The polarization microscope 10, capable of observing the magnetized state of the measuring target, is equipped with a stage 40 on which the measuring target is arranged; a pancake coil 32 having a flat shape and having a through-hole 32a provided at its center part; a flat plat-shaped coil holder 31, having a light transmission port formed to its central part and holding the pancake coil 32 to the part of the light-transmitting port and a plurality of adjusting screws 36, etc. for fixing the coil holder 31, in a state capable of positionally adjusting the same in the direction vertical, with respect to the surface of the stage between the stage 40 and an object lens 14. The light from the measuring target 50 passes through the control transmission port of the coil holder 31 and the through-hole 32a of the pancake coil 32, and is condensed by the object lens 14. COPYRIGHT: (C)2008,JPO&INPIT