FLEXIBLE WIRING BOARD, INSPECTION DEVICE FOR LIQUID CRYSTAL PANEL, AND INSPECTION METHOD FOR LIQUID CRYSTAL PANEL

PROBLEM TO BE SOLVED: To securely input an inspection signal to an input terminal of a liquid crystal panel by suppressing damage to a flexible wiring board. SOLUTION: The flexible wiring board 10 has a flexible substrate 11 and has conductive films 12 provided in lines on the flexible substrate 11,...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAZATO HARUYOSHI, MATSUO TOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS PRINTED CIRCUITS TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To securely input an inspection signal to an input terminal of a liquid crystal panel by suppressing damage to a flexible wiring board. SOLUTION: The flexible wiring board 10 has a flexible substrate 11 and has conductive films 12 provided in lines on the flexible substrate 11, and inputs the inspection signal to the input terminal 22 formed on a liquid crystal panel 20 through the conductive films 12 to inspect illumination of the liquid crystal panel 20. A pair of abutting parts 15 which extend along the conductive films 12 in parallel to each other and abut against circumferences of the input terminal 22 of the liquid crystal panel 20 respectively are provided on both sides in the extending directions of the conductive films 12, and the height of each abutting part 15 is equal to the sum of the height of the input terminal 22 and the film thickness of the conductive films 12. COPYRIGHT: (C)2008,JPO&INPIT