METHOD FOR MEASURING TERMINAL HEIGHT OF ELECTRONIC COMPONENT

PROBLEM TO BE SOLVED: To provide a method for measuring a terminal height which measures a height of an electronic component even if a position of the electronic component is deviated in error. SOLUTION: In a method for measuring a terminal height of an electronic component 8 for measuring a height...

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Bibliographische Detailangaben
Hauptverfasser:	WAKABAYASHI CHIEKO, NEMOTO ETSUO, KONNO TAKASHI, HACHIMAN NAOYUKI, ABE YOSHIAKI
Format:	Patent
Sprache:	eng
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PRINTED CIRCUITS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a method for measuring a terminal height which measures a height of an electronic component even if a position of the electronic component is deviated in error. SOLUTION: In a method for measuring a terminal height of an electronic component 8 for measuring a height of a terminal 9 by a light section method, with a line beam scanning preformed by subjecting the electronic component 8 to pulse lighting by laser beam, a position of the terminal 9 of the electronic component 8 is obtained by continuous lighting of the laser beam, and a laser beam lighting positional correction is performed for measuring the terminal height from the position information thus obtained. COPYRIGHT: (C)2007,JPO&INPIT