INFRARED TWO-WAVELENGTH PROCESSING METHOD

INFRARED TWO-WAVELENGTH PROCESSING METHOD

PROBLEM TO BE SOLVED: To provide an infrared two-wavelength processing method capable of determining accurately a target temperature and a distance to the target from an output value from a two-wavelength infrared camera, even when the distance to the target is unknown or when a wavelength band wher...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: OKAMURA HISAHIRO, NAGASHIMA MITSUHIRO
Format: Patent
Sprache:eng
Schlagworte:
COLORIMETRY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
PHYSICS
RADIATION PYROMETRY
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an infrared two-wavelength processing method capable of determining accurately a target temperature and a distance to the target from an output value from a two-wavelength infrared camera, even when the distance to the target is unknown or when a wavelength band wherein an atmospheric attenuation rate is fluctuated greatly is used. SOLUTION: The atmospheric attenuation rate is calculated by using an atmospheric transmittance calculation software MODTRAN or the like from measured temperature, humidity and visibility, and a relational expression between output values S1, S2from the two-wavelength infrared camera 3 and the temperature and the distance of the target is derived. A measured output value from the two-wavelength infrared camera 3 is substituted for the relational expression, and nonlinear simultaneous equations are solved, to thereby determine the temperature and the distance of the target. COPYRIGHT: (C)2007,JPO&INPIT