METHOD FOR SPECIFYING CUT POSITION AND CUTTING FREQUENCY OF DNA IN CELL CAUSED BY OUTSIDE STRESS BY ONE BASE UNIT

PROBLEM TO BE SOLVED: To provide a method for specifying the cut position of a DNA in a cell formed by an outside stress by one base unit; and also to provide a method for measuring the cut frequency of the DNA in the cell caused by the outside stress by one base unit. SOLUTION: The disclosed is bas...

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Bibliographische Detailangaben
Hauptverfasser: SAKAMOTO AYANORI, ONUKI TOSHIHIKO, FUJII ARIOKI, NARUMI KAZUNARI
Format: Patent
Sprache:eng
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