APPARATUS FOR NONDESTRUCTIVE EVALUATION OF INSULATING COATING FILM

PROBLEM TO BE SOLVED: To provide an apparatus (10) for determining the thickness and thermal conductivity of an insulating coating film (14) applied onto a substrate (16) of an object (12). SOLUTION: The apparatus includes a light source (20) for irradiating a plurality of optical pulses (24) at hig...

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Bibliographische Detailangaben
Hauptverfasser:	RINGEMACHER HARRY ISRAEL, ROZIER ELENA
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an apparatus (10) for determining the thickness and thermal conductivity of an insulating coating film (14) applied onto a substrate (16) of an object (12). SOLUTION: The apparatus includes a light source (20) for irradiating a plurality of optical pulses (24) at high speed to a surface of the object (12), where the surface includes the insulating coating film (14). The system further includes a recording system (28) configured to collect data (26)representative of the propagation of the optical pulses in the object (12). The apparatus further includes a processor (34) coupled to the recording system (28) and configured to receive data (36) from the recording system (28) and configured to determine the thickness and thermal conductivity of the insulative coating (14). COPYRIGHT: (C)2007,JPO&INPIT