MEASURING CIRCUIT, AND MEASURING APPARATUS USING SAME
PROBLEM TO BE SOLVED: To provide a measuring circuit capable of reducing a mounting area for an LSI, and capable of compactifying also an apparatus, and the measuring apparatus using the same. SOLUTION: The apparatus for measuring input energy of a radiation or the like is constituted of a detecting...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a measuring circuit capable of reducing a mounting area for an LSI, and capable of compactifying also an apparatus, and the measuring apparatus using the same. SOLUTION: The apparatus for measuring input energy of a radiation or the like is constituted of a detecting element group 19 for converting the input energy into an electric signal, an analog signal processing circuit 39 for short-wave-shaping the electric signal to generate a trigger signal of indicating that an input waveform exceeds a set threshold, and for holding a wave height value of a peak, an A/D converter 50 for converting the wave height value into a digital signal, and a digital signal processing circuit 79 for controlling the analog signal processing circuit 39 and the A/D converter 50, and for acquiring an input position and the wave height value to transmit data. The detecting element group 19 is formed into a micro strip type detecting element group with a detection range divided matrixlikely to output an X-axial detection signal 17 and a Y-axial detection signal 18 extended orthogonally each other, to reduce the number of input and output signal pins and the measuring circuits for the analog LSI and the digital LSI. COPYRIGHT: (C)2007,JPO&INPIT |
---|