IMPEDANCE ANALYZING PROGRAM, STORAGE MEDIUM, AND ANALYZING METHOD AND APPARATUS

PROBLEM TO BE SOLVED: To provide an impedance analyzing program, a storage medium, an analyzing method and an analyzing apparatus, which can obtain a characteristic impedance at each point of electric wiring, even in the case that the object to be analyzed is a complex and large-scale substrate. SOL...

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1. Verfasser:	IWAKI TETSUO
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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creator	IWAKI TETSUO
description	PROBLEM TO BE SOLVED: To provide an impedance analyzing program, a storage medium, an analyzing method and an analyzing apparatus, which can obtain a characteristic impedance at each point of electric wiring, even in the case that the object to be analyzed is a complex and large-scale substrate. SOLUTION: A step voltage is input to the electric wiring of a substrate model, and a time-domain electromagnetic field analysis is applied to the electric wiring on the substrate being selected as the object. Then, the characteristic impedance at each observation point on the electric wiring is sequentially estimated in accordance with the propagation path of the step voltage, based on voltage comparisons between adjacent observation points. COPYRIGHT: (C)2007,JPO&INPIT
format	Patent
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SOLUTION: A step voltage is input to the electric wiring of a substrate model, and a time-domain electromagnetic field analysis is applied to the electric wiring on the substrate being selected as the object. Then, the characteristic impedance at each observation point on the electric wiring is sequentially estimated in accordance with the propagation path of the step voltage, based on voltage comparisons between adjacent observation points. COPYRIGHT: (C)2007,JPO&INPIT</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070614&DB=EPODOC&CC=JP&NR=2007147373A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20070614&DB=EPODOC&CC=JP&NR=2007147373A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>IWAKI TETSUO</creatorcontrib><title>IMPEDANCE ANALYZING PROGRAM, STORAGE MEDIUM, AND ANALYZING METHOD AND APPARATUS</title><description>PROBLEM TO BE SOLVED: To provide an impedance analyzing program, a storage medium, an analyzing method and an analyzing apparatus, which can obtain a characteristic impedance at each point of electric wiring, even in the case that the object to be analyzed is a complex and large-scale substrate. SOLUTION: A step voltage is input to the electric wiring of a substrate model, and a time-domain electromagnetic field analysis is applied to the electric wiring on the substrate being selected as the object. Then, the characteristic impedance at each observation point on the electric wiring is sequentially estimated in accordance with the propagation path of the step voltage, based on voltage comparisons between adjacent observation points. 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subjects	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
title	IMPEDANCE ANALYZING PROGRAM, STORAGE MEDIUM, AND ANALYZING METHOD AND APPARATUS
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