IMPEDANCE ANALYZING PROGRAM, STORAGE MEDIUM, AND ANALYZING METHOD AND APPARATUS

PROBLEM TO BE SOLVED: To provide an impedance analyzing program, a storage medium, an analyzing method and an analyzing apparatus, which can obtain a characteristic impedance at each point of electric wiring, even in the case that the object to be analyzed is a complex and large-scale substrate. SOL...

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1. Verfasser: IWAKI TETSUO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide an impedance analyzing program, a storage medium, an analyzing method and an analyzing apparatus, which can obtain a characteristic impedance at each point of electric wiring, even in the case that the object to be analyzed is a complex and large-scale substrate. SOLUTION: A step voltage is input to the electric wiring of a substrate model, and a time-domain electromagnetic field analysis is applied to the electric wiring on the substrate being selected as the object. Then, the characteristic impedance at each observation point on the electric wiring is sequentially estimated in accordance with the propagation path of the step voltage, based on voltage comparisons between adjacent observation points. COPYRIGHT: (C)2007,JPO&INPIT