INSPECTING METHOD OF OPTICAL RECORDING MEDIUM

PROBLEM TO BE SOLVED: To provide a simple and low-cost inspecting method of a poor medium in which the thickness of a recording layer separated from a predetermined extent in the manufacturing process of the optical recording medium having at least first dielectric layer, the recording layer, a second dielectric layer, and a reflective layer at this order or inverse order. SOLUTION: (1) In the manufacturing process of the optical recording medium having at least the first dielectric layer, the recording layer, the second dielectric layer, and the reflective layer set on a substrate, (1) the inspecting method of the optical recording medium characterized by detecting the abnormalities of the thickness of the recording layer by irradiating the infrared ray from the first dielectric layer side after the above-mentioned respective layers are stacked on the substrate, infrared radiation is irradiated from the first dielectric layer side, and the reflective intensity is measured, the measured value of this infrared reflective intensity is contrasted with the nominal infrared reflective intensity which investigated beforehand the infrared reflective intensity in a predetermined target recording layer membrane thick enclosure, and established it. (2) The inspecting method of the optical recording medium given in the (1) whose infrared wavelength is 900-1,100 nm. COPYRIGHT: (C)2007,JPO&INPIT