THREE-DIMENSIONAL MEASURING PROJECTOR AND SYSTEM

PROBLEM TO BE SOLVED: To improve efficiency in wide-area, noncontact three-dimensional measurement and facilitate its automation using a projector projecting a target pattern. SOLUTION: The three-dimensional measuring projector 80 comprises: a projection section 12 for projecting a measurement patte...

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1. Verfasser: TAKACHI NOBUO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To improve efficiency in wide-area, noncontact three-dimensional measurement and facilitate its automation using a projector projecting a target pattern. SOLUTION: The three-dimensional measuring projector 80 comprises: a projection section 12 for projecting a measurement pattern P indicating a measurement point Q onto the surface of an object under measurement; a pattern projection control section 493 for controlling the projection section 12 to allow the measurement pattern P to be projected onto the projection section 12; a pattern detection section 491 for detecting the measurement point Q through a photographed image of the measurement pattern P projected by the projection section 12; and a pattern formation section 492 for forming a second measurement pattern with measurement points added, deleted, or changed on the basis of the displacement of the measurement point Q in a first measurement pattern detected by the pattern detection section 491. COPYRIGHT: (C)2007,JPO&INPIT