METHOD OF MEASURING PARAMETER OF ELASTIC WAVE ELEMENT

PROBLEM TO BE SOLVED: To precisely measure an equivalent circuit parameter of a quartz oscillator with a small Q value. SOLUTION: A susceptance value of an equivalent circuit parameter of the quartz oscillator is measured in a measuring point 1 sufficiently distant from a resonance frequency area. A...

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Hauptverfasser: OKAHATA SHIGEO, KOSEKI TOMOMITSU, YOSHIMINE KOJI, FURUSAWA HIROYUKI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To precisely measure an equivalent circuit parameter of a quartz oscillator with a small Q value. SOLUTION: A susceptance value of an equivalent circuit parameter of the quartz oscillator is measured in a measuring point 1 sufficiently distant from a resonance frequency area. A frequency having a susceptance providing a capacitance found from the susceptance value is found to serve as a resonance frequency Fs. A conductance value is found further in a resonance point, and a frequency having a half value of the conductance value is found to serve as quadrant frequencies F1, F2. The measurement from the second measurement is carried out in measuring points 1, 4, 5, 2, 8, 3, 6, 7. The resonance frequency Fs is found by a linear interpolation between the measuring points 2, 3, and the quadrant frequencies F1, F2 are found by linear interpolations between the measuring points 4, 5, and between the measuring points 6, 7. COPYRIGHT: (C)2007,JPO&INPIT